articles
Building optimal test sets for checking complex digital devices
Rubric: Models and methods
Authors: Atovmyan I. O., Berezkin E., Kovalevskiy S., SHuvalov V. B.
The author:
Atovmyan I. O.
Degree:
Doctor of Engineering, Professor, Acting Head of Intelligent Control Systems Department, National Research Nuclear University MEPhI
Location:
Moscow
All articles:
Experience of developing and testing embedded microkernel operating system
Training laboratory tools for cluster systems study
Collecting and processing historical data in automated information systems
Building optimal test sets for checking complex digital devices
Building optimal test sets for checking complex digital devices
The author:
Berezkin E.
Degree:
Ph. D. (Eng.), Associate Professor of National Research Nuclear University MEPhI (NRNU MEPhI)
Location:
Moscow
All articles:
The author:
Kovalevskiy S.
Degree:
Doctor of Technical Sciences, Professor of National Research Nuclear University MEPhI (NRNU MEPhI)
Location:
Moscow
All articles:
The author:
SHuvalov V. B.
Degree:
Ph. D. (Eng.), Associate Professor, Intelligent Control Systems Department, National Research Nuclear University MEPhI
Location:
Moscow
