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Atovmyan I. O.

Degree	Doctor of Engineering, Professor, Acting Head of Intelligent Control Systems Department, National Research Nuclear University MEPhI
E-mail	IOAtovmyan@mephi.ru
Location	Moscow
Articles	Experience of developing and testing embedded microkernel operating system The process of developing an embedded operating system based on a GNU/Mach microkernel. The development was carried out by transferring the GNU/ Mach microkernel for the ARM architecture followed by development of the Ethernet driver, and running TCP/IP stack as a separate module servers. The comparative performance evaluation is presented. Read more... Training laboratory tools for cluster systems study The goals and features of laboratory tools based on the open systems concept for studying the cluster systems scope and functioning properties, which allows to solve the problem of choosing the computational process rational organization taking into account the cluster system and technical parameters as well as the interaction tasks and their characteristics. In order to select the rational construction the GPSS World simulation models were developed. Read more... Collecting and processing historical data in automated information systems This paper deals with the issues of the automated systems historical data accumulation as well as data processing and analysis for scheduling and maintenance of the system. A method of collection of historical data, providing the possibility to store detailed information about all the changes of the stored information is suggested, the main advantages and disadvantages of this method are described. The authors provide some methods of processing and analyzing of the collected data applicable in different stages of a system development, as well as in the course of its operation and maintenance. Read more... Building optimal test sets for checking complex digital devices The basic principles for combining test checks of individual modules constituting the digital device into a single test program are described. Association of checks is conducted under incomplete information concerning reactions of the faulty device. Properties of optimum ordered sequence of checks in the test are formulated. Heuristic checks ordering algorithms are offered. Read more... Building optimal test sets for checking complex digital devices The basic principles for combining test checks of individual modules constituting the digital de‑ vice into a single test program are described. Association of checks is conducted under incomplete information concerning reactions of the faulty device. Properties of optimum ordered sequence of checks in the test are formulated. Heuristic checks ordering algorithms are offered. Read more...