Key words
Digital device, module, check, optimality sign, аn ordered sequence, test program
articles
Authors:
Atovmyan I. O., Berezkin E., Kovalevskiy S., SHuvalov V. B. Published in
№ 2(50)
21 april 2014 year
Rubric: Models and methods
Rubric: Models and methods
Building optimal test sets for checking complex digital devices
The basic principles for combining test checks of individual modules constituting the digital device into a single test program are described. Association of checks is conducted under incomplete information concerning reactions of the faulty device. Properties of optimum ordered sequence of checks in the test are formulated. Heuristic checks ordering algorithms are offered.
The author:
Atovmyan I. O.
Degree:
Doctor of Engineering, Professor, Acting Head of Intelligent Control Systems Department, National Research Nuclear University MEPhI
Location:
Moscow
All articles:
Experience of developing and testing embedded microkernel operating system
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Building optimal test sets for checking complex digital devices
Building optimal test sets for checking complex digital devices
The author:
Berezkin E.
Degree:
Ph. D. (Eng.), Associate Professor of National Research Nuclear University MEPhI (NRNU MEPhI)
Location:
Moscow
All articles:
The author:
Kovalevskiy S.
Degree:
Doctor of Technical Sciences, Professor of National Research Nuclear University MEPhI (NRNU MEPhI)
Location:
Moscow
All articles:
The author:
SHuvalov V. B.
Degree:
Ph. D. (Eng.), Associate Professor, Intelligent Control Systems Department, National Research Nuclear University MEPhI
Location:
Moscow
