Authors

Berezkin E.

Degree	Ph. D. (Eng.), Associate Professor of National Research Nuclear University MEPhI (NRNU MEPhI)
E-mail	efberezkin@mephi.ru
Location	Moscow
Articles	Building optimal test sets for checking complex digital devices The basic principles for combining test checks of individual modules constituting the digital device into a single test program are described. Association of checks is conducted under incomplete information concerning reactions of the faulty device. Properties of optimum ordered sequence of checks in the test are formulated. Heuristic checks ordering algorithms are offered. Read more... Building optimal test sets for checking complex digital devices The basic principles for combining test checks of individual modules constituting the digital de‑ vice into a single test program are described. Association of checks is conducted under incomplete information concerning reactions of the faulty device. Properties of optimum ordered sequence of checks in the test are formulated. Heuristic checks ordering algorithms are offered. Read more...